Get Applied scanning probe methods IX: characterization PDF

By Luca Gavioli, Cinzia Cepek (auth.), Masahiko Tomitori, Bharat Bhushan, Harald Fuchs (eds.)

ISBN-10: 3540740821

ISBN-13: 9783540740827

The luck of the Springer sequence utilized Scanning Probe equipment I–VII and the speedily increasing actions in scanning probe improvement and purposes all over the world made it a traditional step to assemble additional speci c ends up in the elds of improvement of scanning probe microscopy options (Vol. VIII), characterization (Vol. IX), and biomimetics and business purposes (Vol. X). those 3 volumes supplement the former set of volumes lower than the topic themes and provides perception into the new paintings of best experts of their respective elds. Following the culture of the sequence, the chapters are prepared round ideas, characterization and biomimetics and business functions. quantity VIII makes a speciality of novel scanning probe thoughts and the certainty of tip/sample interactions. issues contain close to eld imaging, complex AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever platforms, mixtures of AFM sensors and scanning electron and ion microscopes, calibration equipment, frequency modulation AFM for software in beverages, Kelvin probe strength microscopy, scanning capacitance microscopy, and the size of electric shipping houses on the nanometer scale. Vol. IX makes a speciality of characterization of fabric surfaces together with structural in addition to neighborhood mechanical characterization, and molecular platforms. the amount covers a extensive spectrum of STM/AFM investigations together with fullerene layers, strength spectroscopy for probing fabric homes mostly, organic lms .and cells, epithelial and endothelial layers, clinical similar platforms akin to amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical homes ofpolymernanostructures, technical polymers, and close to eld optics.

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459 Subject Index . . . . . . . . . . . . . . . . . . 469 14 15 16 Contents – Volume II 1 2 3 4 5 Higher Harmonics in Dynamic Atomic Force Microscopy Robert W. Stark, Martin Stark . . . . . . . . . . 1 Atomic Force Acoustic Microscopy Ute Rabe . . . . . . . . . . . . . . . . 37 Scanning Ion Conductance Microscopy Tilman E. Schäffer, Boris Anczykowski, Harald Fuchs . . . . 91 Spin-Polarized Scanning Tunneling Microscopy Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner .

While these observations were still in agreement with a rigid band filling of the LUMO band, the observed insulating nature of stable phases with two or four electrons per molecule, for example (Na, Cs, Li)2 C60 and (K, Rb, Na, Cs)4 C60 , clearly breaks this picture [1, 76, 82], indicating that correlation effects play an important role [70, 75, 82, 83, 85, 86]. This subject has been recently addressed for a Kx C60 monolayer on Au(111) for 3 < x < 4 [76], showing that the interplay between molecular electronic and lattice degrees of freedom (intramolecular and intermolecular atomic displacements) 13 Ultrathin Fullerene-Based Films via STM and STS 9 is particularly important in fullerenes, because the energy scale of their electron– lattice interaction is comparable to their electronic bandwidths [82, 87].

23 Low-Noise Methods for Optical Measurements of Cantilever Deflections Tilman E. Schäffer . . . . . . . . . . . . . . 51 Q-controlled Dynamic Force Microscopy in Air and Liquids Hendrik H¨olscher, Daniel Ebeling, Udo D. Schwarz . . . . 75 High-Frequency Dynamic Force Microscopy Hideki Kawakatsu . . . . . . . . . . . . . . 99 Torsional Resonance Microscopy and Its Applications Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan . .

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Applied scanning probe methods IX: characterization by Luca Gavioli, Cinzia Cepek (auth.), Masahiko Tomitori, Bharat Bhushan, Harald Fuchs (eds.)


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