Download PDF by Professor Bharat Bhushan, Professor Dr. Harald Fuchs,: Applied Scanning Probe Methods

By Professor Bharat Bhushan, Professor Dr. Harald Fuchs, Professor Dr. Sumio Hosaka (auth.)

ISBN-10: 3540005277

ISBN-13: 9783540005278

ISBN-10: 364235792X

ISBN-13: 9783642357923

This quantity examines the actual and technical origin for contemporary growth in utilized near-field scanning probe suggestions. It constitutes a well timed finished evaluation of SPM functions, now that commercial purposes span topographic and dynamical floor reports of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. After laying the theoretical history of static and dynamic strength microscopies, together with sensor know-how and tip characterization, contributions element purposes similar to macro- and nanotribology, polymer surfaces, and roughness investigations. the ultimate half on business learn addresses specific functions of scanning strength nanoprobes resembling atomic manipulation and floor amendment, in addition to unmarried electron units according to SPM. Scientists and engineers both utilizing or making plans to take advantage of SPM thoughts will enjoy the overseas point of view assembled within the book.

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It is interesting to note in this context that Israelachvili [50] has pointed out a quantitative relationship between lateral and vertical (with respect to the surface) dissipation. He states that the hysteresis in vertical force-distance curves should equal the energy loss in lateral friction. An experimental confirmation of this conjecture at the molecular level is still missing. Physical interpretation of energy dissipation processes at the atomic scale seems to be a daunting task at this point.

In fact, there is no quantitative theory for AM-AFM available, which allows the experimentalist to unambiguously convert the experimental data to a force-distance relationship. 7. ~! . Q) 15 .. "'C ::::J Q. E ra - 01---- , - z-position The qualitative behavior for amplitude versus zo-position curves is depicted in Fig. 7. At large distances, where the forces between tip and sample are negligible, the cantilever oscillates with its free oscillation amplitude. Upon approach of the probe towards the surface the interaction forces cause the amplitude to change, resulting typically in an amplitude getting smaller with continuously decreasing tip-sample distance.

20. Rheological model applied to describe the dynamic AFM system, comprising the oscillating cantilever and tip interacting with the sample surface. The movement of the cantilever base and the tip is denoted as Zd(t) and z(t), respectively. The cantilever is characterized by the spring constant k and the damping constant a. g. air damping A. Schirmeisen et al. 34 Assuming a sinusoidal steady-state response and that the base of the cantilever is driven sinusoidally (see Eq. 6) with amplitude Ad and frequency cu, the deflection from equilibrium of the end of the cantilever follows Eq.

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Applied Scanning Probe Methods by Professor Bharat Bhushan, Professor Dr. Harald Fuchs, Professor Dr. Sumio Hosaka (auth.)

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